Discrete Dislocation Dynamics
A multiscale modeling approach is being developed in our laboratory to
capture the plasticity size effects observed in FCC polycrystalline
thin films subjected to pure tension.
3D Discrete Dislocation Dynamics mesoscopic simulations (using the
parallelized code PARANOID developed by Dr. Schwarz, IBM Research)
are carried out to better understand the effects of dislocation
sources. In this approach, we consider a single crystal free
standing films as a model of a columnar grain. The numerical results
will be compared qualitatively with experimental measurements obtained
in freestanding films and TEM observations of the tested specimens.
The methodology will be extended to bi-crystals and multigrains in
which grain boundaries and twin boundaries are obstacles to dislocation
motion. For instance, Fig. 1 displays the evolution of dislocation
loops models as Frank-Reed sources of various strengths randomly
distributed within the grain.
A grain level FEM model based on Crystal Plasticity (UMAT-Abaqus) is used to
take into account initial grain orientations and texture development during
deformation through a representative volume element (RVE) of the tested samples.
A new criterion describing the onset of plasticity for freestanding thin films
is being incorporated in this continuum model based on the results of atomistic
simulations and discrete dislocation dynamics simulations. The geometry of the
RVE is based on polyhedrons obtained by Voronoi tessellations to represent more
realistically the 3D extension of grain boundaries.
To couple simulation approaches in a "hierarchical" way.
- Horacio D. Espinosa (PI)
- Michele Panico (Graduate student)
- Stephane Berbenni (Post-Doc)
- Huang Tang (Post-Doc)
- Brian Hyde (Post-Doc)
- Dr. Klaus W. Schwarz (IBM Research, Yorktown Heights, NY)
- Dr. Diana Farkas (Virginia Tech)
- Dr. Mike Baskes (Los Alamos National Lab)
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