Reading Materials

Lab 1

Required Readings

• R. D. Piner et al., "Dip-Pen Nanolithography," Science 283, 661 (1999).
• B. Bhushan, Handbook of Micro/Nano Tribology, 2nd ed., CRC Press, Boca Raton, FL, 1999.

Recommended Readings

• S. Hong and C. A. Mirkin, "A Nanoplotter with Both Parallel and Serial Writing Capabilities," Science 288, 1808 (2000).
• X. Liu et al., "Arrays of Magnetic Nanoparticles Patterned via "Dip-Pen" Nanolithography," Advanced Material 14 (3), 231 (2002).
• K.-B. Lee et al., "Protein Nanoarrays Generated By Dip-Pen Nanolithography," Science 295, 1702 (2002).
• L. M. Demers et al., "Orthogonal Assembly of Nanoparticle Building Blocks on Dip-Pen Nanolithographically Generated Templates of DNA," Angew. Chem. Int. Ed. 40 (16), 3071 (2001).
• D. L. Wilson et al., "Surface Organization and Nanopatterning of Collagen by Dip-Pen Nanolithography," Proc. Natl. Acad. Sci. 98 (24), 13660 (2001).
• L. M. Demers and C. A. Mirkin, "Combinatorial Templates Generated by Dip-Pen Nanolithography for the Formation of Two-Dimensional Particle Arrays," Angew. Chem. Int. Ed. 40, 3069 (2001).
• M. Zhang et al., "A MEMS Nanoplotter with High-Density Parallel Dip-Pen Nanolithography Probe Arrays," J. Nanotechnology 13, 212 (2002).
• P. I. Pden et al., "AFM Imaging, Roughness Analysis and Contact Mechanics of Magnetic Tape and Head Surfaces," Journal of Tribology 144, 666 (1992).
• N. Almqvist, "Fractal Analysis of Scanning Probe Microscopy Images," Surface Science 355, 221 (1996).

Lab 2

Required Readings

• M. F. Doerner and W. D. Nix, "A method for interpreting the data from depth-sensing indentation instruments,” Journal of Material Research 1(4), 601(1986).
• W.C. Oliver and G. M. Pharr, “An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments,” Journal of Material Research, 7(6), 1564 (1992).
• Bharat Bhushan, “Nanomechanical Properties of solid surfaces and thin films,” chapter 10 of Handbook of Micro/Nano Tribology, 2^nd Editon, CRC press, 1999.

Recommended Readings

• J. L. Hay, "Instrumented Indentation Testing,” ASM Handbook.
• H, Gao, et al., “Elastic contact versus indentation modeling of multi-layered materials,” International Journal of Solids Structures 29(20), 2471, 1992.
• R. B. King, “Elastic Analysis of some punch problems for a layered medium,” International Journal of Solids Structures 23(12), 1657, 1987.

Lab 3 :: Design and Fabrication of Microchannels

Introduction

• Microchannels by bulk micromachining: J. Microelectromech. Sys. 9, 94 (2000).
• Microchannels by surface micromachining: Chapter 3 in Fundamentals and Applications of Microfluidics (Artech House, Norwood, MA, 2002; ISBN 1580533434; Publisher, Amazon).
• Thick resist lithography: Chapter 3 in Fundamentals and Applications of Microfluidics (Artech House, Norwood, MA, 2002).
• Soft lithography: Ann. Rev. Mat. Sci. 28, 153 (1998).

Applications

• Microneedles: Annu. Rev. Biomed. Eng. 2, 289 (2000).
• Micropipette arrays: IEEE Trans. Biomed. Eng. 47 (6), 812 (2000).
• Capillary electrophoresis (CE) system: Anal. Chem. 70, 4974 (1998).
• 3D microfluidic system: Anal. Chem. 72, 3158 (2000).
• Cell sorter, pump, optical lens: Science 290, 1536 (2000).
• Nanopore for molecular sensing: Nano Lett. 3 (1), 37 (2003).
• Microcontact printing: Annu. Rev. Mater. Sci. 28, 153 (1998).

Lab 4 :: Surface Properties and Fluid Transport

Basic

• Particle image velocimetry (PIV): Chapters 4 and 5 in Particle Image Velocimetry (Springer, New York, NY, 1998; ISBN 3540636838; Publisher, Amazon).
• Micro particle image velocimetry (µ-PIV): Exp. Fluids 25, 316 (1998).
• Experimental flow characterization: Chapter 4 in Fundamentals and Applications of Microfluidics (Artech House, Norwood, MA, 2002).
• Volume illumination for 2D PIV: Meas. Sci. Technol. 11, 809 (2000).
• Various measurement techniques for microfluidics: literature.
• Posters: particle image velocimetry | planar laser-induced fluorescence.

Advanced

• Advanced algorithms for µ-PIV: AIAA Journal 40, 1047 (2001).
• Estimation of time-averaged velocity fields: J. Fluids Eng. 122, 285 (2000).
• Modified cross-correlation algorithm for PIV: Exp. Fluids 31, 258 (2001).

Applications

• Flow visualization for l-DNA molecules using fluorescent probe: Biomedical Microdevices 4 (1), 17 (2002).
• Motion analysis of fluorescently stained DNA using correlation method: Nature 388, 151 (1997).

Lab 5 & 6

Required Readings

• Z. Yao et al., "Micromachined Low-Loss Microwave Switches," IEEE J. MEMS 8 (2), 129 (1999).
• Y. Zhu and H. D. Espinosa, "Effect of Temperature on Capacitive RF MEMS Switch Reliability – A Coupled-Field Analysis ," Journal of Micromechanics and Microengineering 14 , 1270 (2004).

Recommended Readings

• J. J. Yao, "RF MEMS from a Device Perspective," J. Micromechanics and Microengineering 10, R9 (2000).
• J. R. Gilbert et al., "3D Modeling of Contact Problems and Hysteresis in Coupled Electro-Mechanics," IEEE MEMS workshop, 127 (1996).
• C. Goldsmith et al., "Performance of Low-Loss RF MEMS Capacitive Switches," IEEE Microwave and Guided Wave Letters 8 (8), 269 (1998).

Lab 7

Required Readings

• Z. Yao et al., "Micromachined Low-Loss Microwave Switches," IEEE J. MEMS 8 (2), 129 (1999).
• J. R. Gilbert et al., "3D Modeling of Contact Problems and Hysteresis in Coupled Electro-Mechanics," IEEE MEMS workshop, 127 (1996).

Recommended Readings

• J. J. Yao, "RF MEMS from a Device Perspective," J. Micromechanics and Microengineering 10, R9 (2000).
• C. Goldsmith et al., "Performance of Low-Loss RF MEMS Capacitive Switches," IEEE Microwave and Guided Wave Letters 8 (8), 269 (1998).

Final Project 1

Required Readings

• R. Krupke, F. Hennrich, H.V. Lohneysen and M.M. Kappes, "Seperation of metallic from semiconducting single-walled carbon nanotubes,"Science, 301 (2003) 344-347.
• N.G.Green and H. Morgan, "Dielectrophoretic investigations of sub-micrometre latex spheres,"J. Phys. D: Appl. Phys. , 30 (1997) 2626-2633.
• A Ramos, et al., "Ac electrokinetics: a review of forces in microelectrode structures,"J. Phys. D: Appl. Phys. , 31 (1998) 2338-2353.
• M.P. Hughes, et al., "Dielectrophoretic investigations of sub-micrometre latex spheres,"J. Phys. D: Appl. Phys. , 31 (1998) 2205-2210.
• N.G. Green and H. Morgan, "Dielectrophoretic separation of nano-particles,"J. Phys. D: Appl. Phys. , 30 (1997) L41-LB4.

Final Project 2

Required Readings

• W. G. Knauss, I. Chasiotis and Y. Huang, "Mechanical measurements at the micron and nanometer scales,"Mechanics of Materials, 35 (2003) 217-231.
• I. Chasiotis and W. G. Knauss, "Investigation of Thin Film Mechanical Properties by Probe Microscopy,"Proceedings of the Int. Society for Optical Engineering (SPIE) , 3512 (1998) 66-75.
• I. Chasiotis and W. G. Knauss, "Microtensile Tests with the Aid of Probe Microscopy for the Study of MEMS Materials,"Proceedings of the Int. Society for Optical Engineering (SPIE) , 4175 (2000) 92-99.
• E. E. Fischer and P. E. Labossiere, "MEMS Fatigue Testing to Study Nanoscale Material Response,"Proc. of the 2002 SEM Annual Conf. & Exp. on Experimental and Applied Mechanics, (2002) 233-235.
• N. Cornille, D. Garcia, M. Sutton, S. McNeil and J.J. Orteu, "Automated 3-D Reconstruction Using a Scanning Electron Microscope,"Proc. of the 2003 SEM Annual Conf. & Exp. on Experimental and Applied Mechanics, (2003).
• Wei Tong, Hong Tao, and Nian Zhang, "Crack Initiation and Growth in a Notched NiTi Shape Memory Alloy Sheet,"Mat. Res. Soc. Symp. Proc., (2004), D7.7.1-D7.7.6.
• Y. Zhu, F. Barthelat, P.E. Labossiere, N. Moldovan, and H.D. Espinosa, "Nanoscale Displacement and Strain Measurement," Proc. of the 2003 SEM Annual Conf. & Exp. on Experimental and Applied Mechanics, (2003).
• B.C. Prorok, Y. Zhu, H.D. Espinosa, Z. Guo, Z.P. Bazant, Y. Zhao and B.I. Yakobson, "Micro- and Nano-mechanics,"Encyclopedia of Nanoscience and Nanotechnology, 5 (2004) 555-600.